Attosecond metrology in a continuous-beam transmission electron microscope
نویسندگان
چکیده
منابع مشابه
Beam-induced motion of adatoms in the transmission electron microscope.
Equations governing the elastic scattering of electrons are applied to the knock-on displacement of atoms along a substrate, yielding analytical expressions for the surface-translation energy, threshold incident energy, and displacement rate. For a surface perpendicular to the incident beam, scattering angles around 90° contribute most to the kinetic energy of surface atoms. Tilting the specime...
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ژورنال
عنوان ژورنال: Science Advances
سال: 2020
ISSN: 2375-2548
DOI: 10.1126/sciadv.abb1393